Materials Characterization & Analysis

Services, Equipment & Capabilities

 

The Manufacturing Innovation Recharge Center provides advanced materials characterization services to help researchers and industry evaluate material properties, manufacturing quality and component performance. Our capabilities support additive manufacturing, metals, polymers, composites and advanced materials research.

Services include:

  • Non-destructive X-ray imaging and internal structure analysis

  • Thermal analysis and thermal conductivity measurements

  • Electrical conductivity measurements and Ultrasound characterization

  • Surface roughness and surface quality evaluation

 

Directed by Dr. Leila Ladani. For equipment access, rates, or scheduling inquiries, please reach out directly.

 

TA DLF-2 WITH EM-1600

The TA Instruments DLF-2 with EM-1600 is an advanced Laser Flash Analysis (LFA) system. It combines a high-energy laser pulse source with a specialized high-temperature environmental module furnace into a single, high-performance instrument.

It is used for the comprehensive thermophysical and thermal transport characterization of materials, such as ceramics, metals, carbons, and composites, across a wide temperature range (up to 1,600°C).

It is a thermal transport analyzer. It tells you how well a material conducts or resists heat (Is it a good thermal insulator or a good heat conductor?).

TA INSTRUMENT SDT 650

The TA Instruments SDT 650 is a premium Simultaneous Thermal Analysis (STA) system. It combines Thermogravimetric Analysis (TGA) and Differential Scanning Calorimetry (DSC) into a single, high-productivity instrument.

It is used for the comprehensive thermal characterization of materials, such as polymers, ceramics, metals, and composites, across a wide temperature range (up to 1,500°C).

It is a thermal stability and phase change analyzer. It tells you what happens to a material when it gets hot (Does it melt? Does it burn? Does it degrade?)

    ZEISS XRADIA 520 VERSA X-RAY CT

    The ZEISS Xradia 520 Versa X-ray CT is a premium 3D X-ray microscopy (XRM) system. It combines high-flux X-ray sources with advanced optical magnification lenses into a single, non-destructive imaging instrument.
    It is used for the comprehensive internal structural characterization of materials, such as composites, rocks, electronics, and biological samples, across a wide range of sample sizes at sub-micron resolution.
    It is a 3D structural and defect analyzer. It tells you what the inside of a material looks like without destroying it (Are there internal cracks? Is there hidden porosity? How are the internal phases distributed?).

      Access, Rates & Scheduling

      Services are available on a fee-for-service basis. For service details, rates, or scheduling, please contact Dr. Leila Ladani ([email protected]), Director of the Manufacturing Innovation Recharge Center.